On October 11, 2016, the USPTO issued U.S. Patent Number 9,465,135 to RAPISCAN SYSTEMS, INC., which was successfully prosecuted by Novel IP.
The ‘135 patent is directed towards a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements.
Independent Claim 1 describes “A scanning method for scanning an object in a scanning zone, the method comprising: irradiating the object with an X-ray radiation source having a peak energy of at least 900 keV, wherein the object is irradiated over a plurality of regions to be scanned within a single irradiation event; detecting X-ray radiation scattered from the object wherein said scattered X-ray radiation is detected from a predefined part of the scanning zone via a detector having a plurality of detector elements and wherein each detector element comprises a first photodetector, a second photodetector, and scintillator material positioned therebetween; determining a point of interaction between photons of said X-ray radiation and said plurality of detector elements by obtaining a first output from the first photodetector and a second output from the second photodetector, and determining a ratio of said first and second outputs; determining a pattern of detector exposures, wherein said pattern of detector exposures is created using a mask to create exposure patterns across multiple detection elements, said mask restricting scattered X-ray radiation that is not from a corresponding part of the scanning zone from reaching its corresponding detector region; and analyzing the pattern of detector exposures to allocate each exposure pattern with a particular radiation source position.”