mobilizing_organizationsgenerating_ideasallocating_resourcesdriving_innovation
Issuance of U.S. Patent Number 9,404,875 to RAPISCAN SYSTEMS, INC.
02 Aug, 2016
News

On August 02, 2016 , the USPTO issued U.S. Patent Number 9,404,875 to RAPISCAN SYSTEMS, INC., which was successfully prosecuted by Novel IP.

The '875 patent  is directed towards  the systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.

Independent Claim 1 describes " A method of differentiating among a plurality of areas of interest in an image wherein each area of interest comprises a matrix of C columns and R rows of pixels, the method comprising: for each of said plurality of areas of interest, using a specially programmed computer to calculate an average of pixel values to determine a signal in each column of R pixels; determine a variance of the signal wherein the variance is determined by calculating a difference between the average and R pixel values to yield R calculated differences, squaring each of said calculated differences to yield a sum of squared differences, summing said squared differences to yield a sum of squared differences, and dividing said sum by R number of pixels; calculate a derivative of said variance for each column of R pixels to yield C number of derivative values for the C columns of pixels; calculate an average derivative value of the C number of derivative values; and using said specially programmed computer, differentiating areas of interest with high atomic numbers from areas of interest with low atomic numbers by comparing the average derivative values of each of said plurality of areas of interest and determining atomic numbers of areas of interest with high atomic numbers by comparing average derivative values of said areas of interest with high atomic numbers to one or more predetermined average derivative values. "